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NXP & Memfault: Higher Quality, Better Performing IoT Devices with Embedded Observability


 

 
About the webinar

NXP and Memfault have collaborated to give IoT device manufacturers in-field device monitoring, crash reporting, and updating capabilities for faster product development, improved device operation, and reduced direct resource costs. 

Together, Memfault and NXP are helping IoT developers build smart cities, smart homes, IIoT, and automotive devices to save time and ease the worry of triaging and troubleshooting, allowing them to focus on building value-added features.

In this webinar you will learn how to:

  • Gain deep insights into embedded device performance in a cloud-based environment
  • Access debugging information without requiring any user interaction, device RMAs, or on-site visits
  • Orchestrate complex OTA updates of firmware in an organized and controlled manner
  • Get started with a project example using Memfault and NXP i.MX RT1060 MCUs

Sign up here and follow this guide to get started with Memfault on your NXP-based devices for free.

Presentation Details:

  • Download the presentation slides here.
  • Presentation: 0:00 – 49:17
  • Q&A from live audience: 49:18 - 1:05:53

 

Speaker

2-1

Kyle Dando

Development Systems Application Engineer, NXP Semiconductors

2021-11-12 09_27_35-Window-1-1

Devon Yablonski

Head of Strategic Partnership, Memfault

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