Join Memfault in Nuremberg, Germany from 9 - 11 April!
Memfault gives embedded engineering teams an off-the-shelf observability solution for their devices deployed in the field. Collect comprehensive crash data and detailed device health metrics from your entire fleet, automatically and remotely. Fix faults in the field in hours instead of days and get fleet-wide health and performance data to help you prioritize and make decisions with confidence. Memfault also includes a built-in solution for the management and distribution of OTA updates so your team can find faults and ship fixes all in one place. Memfault is purpose-built to work on constrained devices, is easy to integrate, and doesn’t require any redesign of your existing systems. It’s compatible with MCU’s running all popular RTOS’s, and Android and Linux devices.
To learn how our embedded observability platform can transform your business, schedule a demo with us at Embedded World using the calendar to the right.
Discover which of our partners are attending Embedded World 2024.
Hall 4A, 4A-310
See our Partner Page
Hall 4A, 4A-138
See our Partner Page
Hall 4A, 4A-222 | 3A-128
See our Partner Page
Below are a few Memfault blogs and webinars to assist you when building, launching, and monitoring your embedded devices. Enjoy!
If you care deeply about product quality post-launch, you should monitor three vital signs for your devices in the field: stability, connectivity, and battery. Collecting these critical measures from your devices gives you the data to start understanding your fleet health and product quality.
Visit our booth at Embedded World to experience a live demo of our latest product release, Device Vitals.
This blog covers the most common reliability metrics that hardware manufacturers use and introduces a novel measurement, Crash Free Hours. We’ll cover exactly what you’ll need to collect on your IoT devices within firmware to measure device reliability and ensure your devices are working as expected.